Fabrication and Characterization of Narrow-Band Bragg-Reflection Filters in Silicon-on-Insulator Ridge Waveguides

Published/Posted: December 1, 2001

Authors: Murphy, T. E.; Hastings, J. T.; Smith, H. I.

DOI: 10.1109/50.971688

Abstract: We describe the design, fabrication and measurement of an integrated-optical Bragg grating filter, operating at a freespace wavelength of 1543 nm, based upon a silicon-on-insulator (SOI) ridge waveguide. The measured spectral response for a 4-mm long grating has a bandwidth of 15 GHz (0.12 nm), and shows good agreement with theoretical predictions.

Citation:
T. E. Murphy, J. T. Hastings and H. I. Smith, "Fabrication and Characterization of Narrow-Band Bragg-Reflection Filters in Silicon-on-Insulator Ridge Waveguides" J. Lightw. Technol. 19(12) 1938-1942 (2001)
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Manuscript: Murphy_JLT_19_1938_2001.pdf